Mahr Metrology MarSurf WI 50 M
The MarSurf WI 50M is a powerful surface profiler for the three-dimensional measurement and analysis of surfaces – contactless, independent of material, and fast.
High performance entry-level solution
Precise measurement in the sub-nanometer range – simple with the new MarSurf WI 50 M. With an intuitive software user guide and very user-friendly design, this 3D measuring instrument is ideal for everyday use in the laboratory and quality management.
The new WI 50 M meets all the requirements of your measuring tasks in the nanometer range – offering maximum performance and impressive value for money. With a minimalistic approach, compact design and large installation space, the tool lives up to its reputation as “an optimal entry-level solution.
Typical measuring tasks
- Roughness measurements as per
ISO 4287 & ISO 13565 / ISO 25178
- Topography measurements (including volume, wear, tribology)
- contour and form (2D, 3D)
- pore, particle analysis
- defect detection