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Mahr Metrology MarSurf WI 100

The MarSurf WI 100 is a high-performance 3D surface profiler with sub-nanometer vertical resolution, ideal for contactless measurement and analysis of large or complex surfaces.

  • High-resolution measurement – up to 0.2 nm vertical resolution.
  • Fast measuring speed – up to 140 fps for efficient data acquisition.
  • White-light interferometry – contactless, material-independent surface analysis.
  • Extended working area – accommodates large sample volumes with manual Z-axis adjustment.

Description

The MarSurf WI 100 | Art.-Nr. 6355002 is a high-end laboratory and quality assurance system designed for precise 3D surface measurement and analysis. Using white-light interferometry, it provides contactless and material-independent measurements with a vertical resolution of up to 0.2 nm, ensuring that even the smallest surface features are accurately captured. Its fast measuring speed of up to 140 fps allows efficient inspection of large surfaces, making it suitable for both laboratory environments and production QA applications.

Equipped with an extended xyz working area, the WI 100 accommodates extra-large samples. The manual Z-axis adjustment allows easy positioning of XXL components, while integrated collision detection protects both the instrument and the workpiece. Typical applications include roughness measurements (ISO 4287 & ISO 13565 / ISO 25178), topography and volume analysis, wear and tribology evaluation, 2D/3D contour and form measurement, pore and particle analysis, and defect detection. With a focus on precision, accuracy, repeatability, and traceable documentation, the MarSurf WI 100 ensures maximum data quality for engineering, product design, process optimization, and quality control.

Features

  • Resolution: up to 0.2 nm vertical

  • Measuring speed: up to 140 fps

  • Measuring principle: White-light interferometry (contactless)

  • LED light source: High-power 650 nm / white

  • Collision detection: xyz-direction

  • Power supply: 100–240 V

  • Surface parameters: ISO 4287, ISO 13565, ISO 25178

  • Extended working area: Manual Z-axis for XXL samples

  • Applications: Roughness, topography, contour, pore/particle analysis, defect detection

  • High data quality: Precise, repeatable, and traceable measurements

Specifications

MarSurf WI 100 | Art.-Nr. 6355002
Resolution up to 0.2 (nm) vertical
Measuring speed up to 140 fps
Measuring principle White light interferometer
High-power LED (650 nm / white)
Other Collision detection in xyz direction
Power supplied 100 – 240 V
Surface parameters ISO 4287, ISO 13565, ISO 25178 …

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