Mahr Metrology MarSurf CM select
Customized measurement solution for your application
The MarSurf CM select is a high-performance, configurable confocal microscope that you can use to measure and analyze surfaces three-dimensionally – non-contact, material-independent and fast .
Typical measurement tasks
- Roughness measurements according to
ISO 4287 & ISO 13565 / ISO 25178
- Topography measurements (including volume, wear, tribology)
- Contour and shape (2D, 3D)
- Pore and particle analysis
- defect detection
Customized measuring solution for your application
As a multi-sensor system, the MarSurf CM select offers the option of combining different sensor technologies in one measuring device. Depending on the measurement task, the optimum point sensor can also be flexibly selected. The MarSurf CM select meets your individual requirements in terms of sample size, automation, measurement convenience and accuracy – right up to a fully automated measurement solution.
Maximum data quality
One of our most important criteria means excellent precision, accuracy, repeatability, reproducibility and documentation for traceability and auditability. Our greatest achievement for the customer is a quantitative measurement that they can rely on in the areas of engineering, product and process design, quality control, etc.