Description
The MarSurf CM explorer | Art.-No. 6350000 is a flexible all-round 3D confocal measuring system designed to deliver precise surface measurement and analysis. Its sub-nanometer vertical resolution of up to 2 nm and fast measuring speed of up to 100 fps allow for high-accuracy evaluations of even the finest surface features. Thanks to its contactless, material-independent measuring principle, the CM explorer can handle a wide variety of workpieces while maintaining measurement integrity.
With a robust, compact design, the MarSurf CM explorer is not only ideal for test and inspection laboratories, but also perfectly suited for quality assurance in production environments. The system supports roughness measurement, 2D/3D contour and shape analysis, topography evaluation including volume, wear, and tribology, pore and particle inspection, and defect detection. Combined with collision detection in xyz directions and full compliance with ISO 4287, ISO 13565, and ISO 25178 standards, it ensures high precision, repeatability, reproducibility, and traceable documentation for engineering, process optimization, and quality control applications.
