Description
The MarSurf WI 50 M is a powerful entry-level 3D surface measuring system, designed for precision surface profiling and analysis in laboratory and quality management settings. Using white-light interferometry, the device delivers contactless, high-speed measurements that are independent of material, making it highly versatile for a wide range of applications. With up to 0.2 nm vertical resolution and measurement speeds of up to 140 fps, the WI 50 M ensures accurate results even for sub-nanometer surface deviations.
This entry-level solution is intuitive and easy to operate, allowing users to complete measurement tasks efficiently while maintaining maximum data quality. It supports roughness, topography (including volume, wear, and tribology), contour/form analysis, and pore or particle inspections, all in 2D and 3D. Designed for reliability, the MarSurf WI 50 M emphasizes precision, reproducibility, and traceable documentation, making it ideal for engineering, product design, process development, and quality control. With its compact design, large installation space, and cost-effective setup, the WI 50 M is the optimal entry-level surface measurement solution.
