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Mahr Metrology MarSurf VD 140

The MarSurf VD 140 is a professional all-in-one surface measuring system combining roughness and contour measurement with a 140 mm probe section for large and heavy workpieces.

  • Resolution: 2.0 nm & 0.2 nm (roughness probe), max. 6 nm (contour probe)
  • Traversing length (X): 0.1–140 mm
  • Guide deviation: 0.20 µm / 60 mm, 0.40 µm / 140 mm, 0.75 µm / 280 mm
  • Measuring force: 0.75 mN (roughness), 4–30 mN (contour, software-adjustable)

Description

The MarSurf VD 140 is a high-performance surface measuring system designed for precision roughness and contour analysis. With its 140 mm tactile section, it enables measurement of both small and large components with maximum speed and flexibility. The system combines roughness and contour measurement in one setup, allowing fast changeover between probes without tools, while maintaining high accuracy and repeatability.

Built on the proven MarSurf platform, the VD 140 ensures short measuring times thanks to high-speed CNC axes and automated measurement sequences. Its innovative clamping system and magnetic probe holders enable quick, safe, and precise workpiece alignment, reducing setup time and improving productivity. The system supports large workpieces up to 90 kg, offering industrial robustness and reliability.

With optimized probe systems, users can perform roughness measurement using the contour probe system at high measuring ranges, enhancing operational efficiency. The MarSurf VD 140 is ideal for production, quality assurance, and laboratory environments, delivering fast, precise, and traceable results across a variety of surfaces and applications.

Features

  • Combined measurement: Roughness and contour in a single system

  • Probe arms: Roughness 45–135 mm, Contour 210–490 mm

  • Traversing length X-axis: 0.1–140 mm

  • Measuring force: 0.75 mN (roughness), 4–30 mN (contour)

  • Resolution: 2.0 nm & 0.2 nm (roughness), 6 nm max (contour)

  • Positioning speed: X: 0.02–200 mm/s, Z: 0.02–50 mm/s

  • Max workpiece weight: 90 kg

  • Fast setup: Tool-free probe changes, magnetic holder, automated sequences

  • Applications: Roughness, contour, topography, pore/particle analysis, QA, lab and production use

Specifications

MarSurf VD 140 | Art. no. 6269020
Resolution with roughness probe system:
Measuring range 1: 2.0 nm
Measuring range 2: 0.2 nmwith contour probe system:
max. 6 nm (with 210 mm probe arm)
Start of traversing length (in X) 0.1 mm
End of traversing length (in X) 140 mm
Traversing length (Lt) 0.1 – 140 mm
Guide deviation with roughness probe system:
0.20 µm / 60 mm
0.40 µm / 140 mm
0.75 µm / 280 mm
Measuring force (N) with roughness probe system:
0.75 mNwith contour probe system:
4 mN to 30 mN, adjustable via software
Measuring speed 0.02 mm/s to 10 mm/s
Positioning speed X axis 0.02 – 200 mm/s
Positioning speed Z-axis 0.02 – 50 mm/s
Probe Roughness probe system (skidless)
Contour probe system
Probe arm length with roughness probe system:
45 mm to 135 mmwith contour probe system:
210 mm to 490 mm
Workpiece weight max. 90 kg
Other functions manual TY
Measuring range mm with roughness probe system
500 µm (±250 µm) for probe arm length 45 mm
1500 µm (±750 µm) for probe arm length 135 mmwith contour probe system
70 mm with probe arm length 350 mm
max. 100 mm with probe arm length 490 mm

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