Description
The MarSurf CM select is a flexible, high-precision surface measurement solution designed for 3D topography and roughness analysis across diverse materials. Using confocal microscopy, it delivers non-contact, material-independent measurements at speeds of up to 100 fps and a vertical resolution of 2 nm, ensuring maximum precision and repeatability for demanding industrial and research applications. Its high-power LED illumination guarantees consistent measurement quality across different surfaces and textures.
As a multi-sensor system, the MarSurf CM select allows users to combine various sensor technologies within a single device. Depending on the measurement task, the system can adapt the optimum point sensor, offering flexibility for roughness, topography, contour, pore/particle analysis, and defect detection. It supports automation, large sample sizes, and highly accurate, reproducible measurements, making it ideal for quality control, product development, and process optimization.
With collision detection in all XYZ directions and support for ISO 4287, ISO 13565, and ISO 25178 standards, this device ensures reliable, traceable, and auditable results, helping engineers and quality specialists make data-driven decisions with confidence.
