Description
The MarSurf CM expert | Art.-No. 6350002 is a powerful laboratory and quality assurance system designed to measure and analyze surfaces three-dimensionally with maximum precision. Its vertical resolution of up to 2 nm combined with fast 100 fps measuring speed ensures highly accurate evaluation of even the smallest surface features. Thanks to the contactless, material-independent confocal measuring principle, the CM expert can analyze a wide variety of workpieces while maintaining measurement integrity.
The system’s robust construction and insensitivity to environmental influences make it suitable for both test laboratories and production environments. With an additional manual Z-positioning axis, large x- and y-travel ranges, and automation options, it offers excellent ease of use and flexibility. Typical measurement tasks include roughness, topography (volume, wear, tribology), 2D/3D contour and shape analysis, pore/particle inspection, and defect detection. With collision detection in xyz directions and compliance with ISO 4287, ISO 13565, and ISO 25178, the CM expert provides traceable, reproducible, and reliable measurement data for engineering, quality control, and process optimization.
