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Obsnapmeter C230

-Two thickness measuring methods adopted, the gauge can be applied to thickness measuring of non-magnetic coating on magnetic metal substrate as well as non-conductive coating on non-magnetic metal substrate;

-Multi type probe can be used (F1,F1/90,F10,N1,N1/90°,N10)

-2 measuring modes are available: continuing measuring mode(CONTINUE)and single measuring mode(SINGLE)

-2 operation modes are available: direct mode (DIRECT) and batch mode (A-B)

-5 statistic values:mean value(MEAN), max. Value(MAX), min. Value(MIN), numbers of measuring(NO.), standard deviation(S.DEV)

-2 methods can be used to calibrate the gauge, and the system error of the probe can be corrected by use of basic calibrating method

-Storage function: 500 measuring values can be stored

Description

Specification Details
Measuring Range 0–1250 µm, depends on probes; max 10 mm for the probe F10
Working Principle Magnetic & Eddy
Substrate Fe / NFe base
Resolution 0.1 µm
Display 128×64 LCD with backlight
Accuracy ±(2%H + 1 µm) Note: H is thickness reading
Memory 5 files × 100 values
Unit Switch Metric (µm) / Imperial (mil)
Working Temperature Operation: –10 °C to 50 °C
Storage: –30 °C to 70 °C
Power AA battery × 2 pcs
Weight 340 g
Size 147 × 74 × 31 mm

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