Description
The MarSurf WI 50 is a powerful and versatile surface profiler, ideal for laboratories, research facilities, and quality assurance environments. It provides fast, contactless, and material-independent measurements using white-light interferometry, with vertical resolution up to 0.2 nm and measuring speeds up to 140 fps. The instrument’s HD stitching function ensures consistently high-resolution measurements across large surfaces, making it suitable for demanding sub-nanometer applications.
With integrated collision detection in all XYZ directions, the MarSurf WI 50 ensures maximum safety for both the workpiece and the instrument, reducing downtime and risk of damage. Users can reliably measure roughness, topography, 2D/3D contour, pores, particles, and detect surface defects, all while ensuring precision, reproducibility, and traceability of the measurement data. This combination of speed, accuracy, and safety makes the WI 50 a flexible all-round solution for modern engineering, product development, process optimization, and quality control.
