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Obsnapmeter C230

This advanced coating thickness gauge accurately measures non-magnetic coatings on magnetic metals and non-conductive coatings on non-magnetic metals. With a measuring range up to 1250 µm (depending on probe) and 0.1 µm resolution, it provides precise results for industrial and laboratory applications. Its 128×64 backlit LCD, multi-probe compatibility, and memory for up to 500 readings make it practical and user-friendly. Lightweight and durable, it is ideal for both single and continuous measurements.

  • Measures non-magnetic and non-conductive coatings on various substrates up to 1250 µm.
  • High resolution of 0.1 µm with ±(2%H + 1 µm) accuracy.
  • Supports multiple probes and measurement modes: single, continuous, direct, and batch.
  • Stores up to 500 readings with statistical functions (mean, max, min, count, standard deviation).

Description

This versatile coating thickness gauge provides precise measurement of non-magnetic coatings on magnetic metal substrates as well as non-conductive coatings on non-magnetic metals. It offers a measuring range up to 1250 µm (depending on the probe) with a high resolution of 0.1 µm and accuracy of ±(2%H + 1 µm). The 128×64 backlit LCD ensures clear readings, while multi-probe compatibility and easy calibration make it suitable for industrial inspections, laboratories, and quality control applications.

Designed for convenience and efficiency, the gauge supports both single and continuous measurement modes, direct and batch operation, and can store up to 500 readings with comprehensive statistical functions including mean, max, min, count, and standard deviation. Lightweight and durable, it is ideal for professionals who require accurate, reliable, and portable coating thickness testing in a variety of environments.

Features

  • Two thickness measuring methods adopted, the gauge can be applied to thickness measuring of non-magnetic coating on magnetic metal substrate as well as non-conductive coating on non-magnetic metal substrate;
  • Multi type probe can be used (F1,F1/90,F10,N1,N1/90°,N10)
  • 2 measuring modes are available: continuing measuring mode(CONTINUE)and single measuring mode(SINGLE)
  • 2 operation modes are available: direct mode (DIRECT) and batch mode (A-B)
  • 5 statistic values:mean value(MEAN), max. Value(MAX), min. Value(MIN), numbers of measuring(NO.), standard deviation(S.DEV)
  • 2 methods can be used to calibrate the gauge, and the system error of the probe can be corrected by use of basic calibrating method
  • Storage function: 500 measuring values can be stored

Specifications

Specification Details
Measuring Range 0–1250 µm, depends on probes; max 10 mm for the probe F10
Working Principle Magnetic & Eddy
Substrate Fe / NFe base
Resolution 0.1 µm
Display 128×64 LCD with backlight
Accuracy ±(2%H + 1 µm) Note: H is thickness reading
Memory 5 files × 100 values
Unit Switch Metric (µm) / Imperial (mil)
Working Temperature Operation: –10 °C to 50 °C
Storage: –30 °C to 70 °C
Power AA battery × 2 pcs
Weight 340 g
Size 147 × 74 × 31 mm

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