Phone

+603-5621 5786

Business Hour

08:30 - 17:30

Mahr Metrology MarSurf UD 130 Aspheric 2D

The MarSurf UD 130 is a high-precision 2D surface measuring station for contour and roughness analysis of optical components. It ensures accurate asphere measurements with sub-300 nm form deviations.

  • Adjustable measuring force: 1 – 30 mN
  • 2D form deviation from best-fit circle: < 300 nm
  • Operating temperature: 15–35 °C (recommended 20 °C ± 2 K)
  • Relative humidity: 25 – 70 %

Description

The MarSurf UD 130 is a precise 2D surface measurement system designed for optical components, such as lenses and rotationally symmetrical aspheres. It allows early detection of surface deviations in the first processing steps, reducing the need for time-consuming post-processing. Measurement results are output in a machine-readable format, enabling integration with processing machines for automated production feedback.

This system offers increased flexibility, allowing various types of aspheres to be measured with a single setup, eliminating additional investments. The high measuring speed and dynamics (up to 5 mm/s for large lenses and as low as 0.1 mm/s for micro-lenses) combined with free probe tip positioning ensures that measurements are both accurate and efficient. The vertical resolution of 2 nm and form deviations of less than 300 nm guarantee reliable reproduction of your optics, even with steep flanks. Probe arms can be changed without recalibration, enhancing workflow efficiency.

Features

  • 2D surface measurement for optical components with <300 nm form deviation

  • X-axis traversing length: 0.1 – 130 mm, resolution 2 nm

  • Probe system: 100 mm / 200 mm arms, adjustable Z-speed 0.1 – 5 mm/s, force 1–30 mN

  • High measuring dynamics: 0.1–5 mm/s, suitable for large and micro lenses

  • Machine-readable output for automated production control

  • Flexible probe positioning for complex surfaces and steep flanks

  • Accurate and reproducible results, vertical resolution 2 nm

  • Operating environment: 15–35 °C, relative humidity 25–70 %

Specifications

Properties of the horizonal axis X
Traversing length 0.1 up to 130 mm
Positioning speed 0.1 up to 30 mm/s
Measuring speed 0.1 up to 5 mm/s
Resolution 2 nm

 

Technical data probe system W
Probe measuring range                                100 mm probe arm 10mm
                                                                          200 mm probe arm 20mm
Positioning speed Z-direction (adjustable) 0.1 up to 5 mm/s
Probing speed Z-direction (adjustable) 0.1 up to 1 mm/s
Resolution 2 nm
Measuring force (adjustable via software) 1 up to 30 mN

 

Lens measurement*1
2D form deviation from the best-fit circle < 300 nm

 

General Data
Operating temperature + 15°C to + 35°C
Suggested working temperature 20°C ± 2 K
Max. temperature change < 0.5 K/h
Relative humidity (non-condensing) 25 % to 70 %

Ready to Transform Your Business? Contact Us Today

Categories

Request a Quote or Further Information

Please fill in the request form below and one of our engineers will contact you to discuss your system requirements and if we can help, our typical response time is within 1 – 3 working day.