Description
The Xrite Ci4100 Compact Benchtop Spectrophotometer is a high-precision instrument designed for fast and accurate color and gloss measurements of a wide range of samples. Featuring a d/8° measurement geometry and a gas-filled tungsten lamp, it delivers reliable short-term repeatability of 0.10 ΔEab on white ceramic and inter-instrument agreement averaging 0.30 ΔEab. With an 8 mm measurement spot and a 14 mm illumination area, it captures data across a spectral range of 400–700 nm at 10 nm intervals, providing detailed spectral analysis with a photometric resolution of 0.01%. The device operates efficiently in standard lab conditions with non-condensing humidity between 5% and 85% and temperatures from 10° to 40°C, making it suitable for consistent use in controlled environments.
Designed for usability and workflow efficiency, the Ci4100 includes a targeting sample arm, LED status panel, and embedded transform support, allowing operators to easily align samples and monitor instrument health. It provides 600 gloss values compliant with ASTM standards, enabling accurate assessment of both matte and glossy surfaces. The spectrophotometer communicates via USB 2.0 and comes with a white calibration standard, black trap, AC adapter, and USB cable.
