Main Function:
· Auto loader/unloader for substrates
· Automated defect classification of inspected units
· Map creation/updates of loaded map
· Optional inking capability for defect units
· Statistical descriptive analysis of defects
Features:
· High-resolution and high-precision X-Y table
· Window platform with user-defined specifications
· Built-in calibration feature
· Library based uploading for different types of unit
Please fill in the request form below and one of our engineers will contact you to discuss your system requirements and if we can help, our typical response time is within 1 – 3 working day.
