Main Function:
· Auto loader/unloader for substrate or lead frame
· Perform automated die-attach inspection & defect classification of inspected die
· Substrate map creation/updates or inking of defect dies
· Statistical descriptive analysis of defects
Vision Inspection Options:
· Device check
· Die Centering position/offset inspection
Silver epoxy coverage inspection
Features:
· High-resolution and high-precision X-Y table
· Multiple inspection stations
· Auto marking for rejects
· Window platform with user-defined specifications
· Built-in calibration feature
· Auto-generation of GR&R report
Library based uploading for different types of die
Please fill in the request form below and one of our engineers will contact you to discuss your system requirements and if we can help, our typical response time is within 1 – 3 working day.
